Chadwin Young

Associate Professor - Materials Science & Engineering
Director of Advanced Electrical Characterization Laboratory (AECL)
Research Group Website
Tags: Electrical Engineering Materials Science and Engineering Computer Engineering

Professional Preparation

Ph.D. - Electrical Engineering
North Carolina State Univ. - 2004
M.S. - Electrical Engineering
North Carolina State Univ. - 1998
B.S. - Electrical Engineering
Univ. of Texas - Austin - 1996

Research Areas

Electrical Characterization and Reliability

Novel Characterization Development

  • Involved the measurement and evaluation of transistors and capacitors of experimental gate stacks and device structures (alternative gate electrodes, ultra-thin oxides, oxynitrides, and high-dielectric constant insulators, non-planar devices, and high mobility substrates)
  • Engaged in the electrical characterization and reliability of projected material and device architectures below the 22 nm node as defined by the International Technology Roadmap for Semiconductors (ITRS) as well as other future device architectures, which can call for high-k dielectrics and high mobility and/or flexible substrate material systems

Research Interests

  • Electrical Characterization Methodologies
  • Reliability Characterization Methodologies
  • Solid State Device Physics
  • Electrical properties of materials
  • MOS modeling (quantum effects, etc.)
  • Nanotechnology
  • Flexible Electronics 
  • Future Energy Needs (Renewable, low power operation, etc.)


K.-W. Ang, K. Majumdar, K. Matthews, C. D. Young, C. Kenney, C. Hobbs, P. D. Kirsch, R. Jammy, R. D. Clark, S. Consiglio, K. Tapily, Y. Trickett, G. Nakamura, C. S. Wajda, G. J. Leusink, M. Rodgers, and S. C. Gausepohl, "Effective Schottky Barrier Height modulation using dielectric dipoles for source/drain specific contact resistivity improvement," in IEEE Int’l Electron Devices Meeting (IEDM), pp. 18.6.1 - 18.6.4, 2012. 2012 - Publication
C. D. Young, G. Bersuker, M. Jo, K. Matthews, J. Huang, S. Deora, K. W. Ang, T. Ngai, C. Hobbs, P. D. Kirsch, A. Padovani, and L. Larcher, "New insights into SILC-based life time extraction," in IEEE International Reliability Physics Symposium, 2012, pp. 5D.3.1-5D.3.5. 2012 - Publication
C. D. Young, K. Akarvardar, M. O. Baykan, K. Matthews, I. Ok, T. Ngai, K.-W. Ang, J. Pater, C. E. Smith, M. M. Hussain, P. Majhi, and C. Hobbs, “(110) and (100) Sidewall Oriented MugFETs:  A Performance and Reliability Investigation,” Solid-State Electronics, 78, pp. 2-10, 2012. 2012 - Publication
C. D. Young, D. Veksler, S. Rumyantsev, J. Huang, H. Park, W. Taylor, M. Shur, and G. Bersuker, "Evaluation of the N- and La-induced defects in the high-κ gate stack using low frequency noise characterization," Microelectronic Engineering, vol. 88, pp. 1255-1258, 2011. 2011 - Publication
C. D. Young, M. O. Baykan, A. Agrawal, H. Madan, K. Akarvardar, C. Hobbs, I. Ok, W. Taylor, C. E. Smith, M. M. Hussain, T. Nishida, S. Thompson, P. Majhi, P. Kirsch, S. Datta, and R. Jammy, "Critical discussion on (100) and (110) orientation dependent transport: nMOS planar and FinFET," in Symposium on VLSI Technology (VLSIT), pp. 18-19, 2011. 2011 - Publication
Invited/Review paper:  Chadwin D. Young, Dawei Heh, Rino Choi, Byoung Hun Lee, and Gennadi Bersuker, “Pulsed Id-Vg methodology and Its Application to the Electron Trapping Characterization of High-k gate Dielectrics,” Journal of Semiconductor Technology and Science, 10, pp. 79-99, 2010. 2010 - Publication
C. D. Young, Y. Zhao, D. Heh, R. Choi, B. H. Lee, and G. Bersuker, "Pulsed Id - Vg Methodology and Its Application to Electron-Trapping Characterization and Defect Density Profiling," IEEE Transactions on Electron Devices, vol. 56, no. 6, pp. 1322-1329, 2009. 2009 - Publication
C. D. Young, G. Bersuker, P. Khanal, C. Y. Kang, J. Huang, C. S. Park, P. Kirsch, H. H. Tseng, and R. Jammy, "Reliability assessment of low |Vt| metal high-kgate stacks for high performance applications," in International Symposium on VLSI Technology, Systems, and Applications, 2009, pp. 65-66. 2009 - Publication
C. D. Young, G. Bersuker, J. Tun, R. Choi, D. Heh, and B.H. Lee, “ “Smart” TDDB Algorithm for Investigating Degradation in High-k Gate Dielectric Stacks under Constant Voltage Stress,” Microelectronic Engineering, pp. 287-290, 2008. 2008 - Publication
Invited paper:  Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, and Gennadi Bersuker, “Electrical Characterization and Analysis Techniques for the High-kEra,” Microelectronics Reliability, 47, pp. 479-488, 2006. 2006 - Publication


Associate Professor
University of Texas at Dallas [2018–Present]
Assistant Professor
University of Texas at Dallas [2012–2018]
Senior Member of Technical Staff
SEMATECH [2010–2012]
Member of Technical Staff
SEMATECH [2008–2010]
Project Engineer
SEMATECH [2006–2008]
Post Doc
SEMATECH [2004–2006]
PhD Intern
SEMATECH [2001–2004]
IBM, Motorola, Four Dimensions, Los Alamos Nat. Lab., etc. [1990–2000]

News Articles

Jonsson School Engineer Gets CAREER Grant for Electronics Work
A University of Texas at Dallas engineer is investigating new semiconductor materials for possible use in large area, flexible electronics. 

Dr. Chadwin Young, an assistant professor of materials science and engineering in the Erik Jonsson School of Engineering and Computer Science, recently received a five-year, $500,000 Faculty Early Career Development (CAREER) award from the National Science Foundation to pursue this work. 

“On one hand, engineers are looking for new materials for transistors that will make electronic devices smaller and faster, and use less power,” Young said. “That’s what semiconductor companies who manufacture computer chips are driven by. But there are also other markets that need transistors to be printed on big sheets of plastic or other flexible substrates at a much reduced cost.”


Professional Memberships
  • Institute of Electrical and Electronics Engineers (IEEE)
  • American Vacuum Society (AVS)
  • Electrochemical Society (ECS)
Professional Service
  • IEEE Semiconductor Interface Specialists Conference – Executive Committee (2011-2013)
  • IEEE International Reliability Physics Symposium – Technical Program Committee (2008-2013)
  • IEEE International Electron Devices Meeting – Technical Program Committee (2011-2012)
  • IEEE Semiconductor Interface Specialists Conference – Technical Program Committee (2008-11)
  • IEEE International Integrated Reliability Workshop – Executive Committee (2005-2010)
  • IEEE International Integrated Reliability Workshop – Technical Program Committee (2005-2012)
  • Workshop on Dielectrics in Microelectronics – Steering Committee Member (2010-present)
Reviewer Activities
  • IEEE Electron Device Letters
  • IEEE Transactions on Electron Devices
  • IEEE Transactions on Device and Materials Reliability
  • Applied Physics Letters
  • Microelectronic Engineering
  • Microelectronic Reliability
  • Solid-State Electronics
  • Guest Editor for IEEE Trans. Device and Materials ReliabilityIIRW Special Issues 2006-07 and 2008-09

List of External Collaborators During Past Four Years:

S. Datta (Penn State), J. DelAlamo (MIT), P. Majhi (Intel), P. Lenahan (Penn State), D.S. Ang (NTU), B.K. Knowlton (Boise State), R.Jammy (SEMATECH),  P.Kirsch (SEMATECH), G. Bersuker (SEMATECH), Jason Ryan (NIST), Jason Campbell (NIST), L. Larcher (U. Modena), A. Padova (U. Modena), R. Choi (Inha Univ., Korea), B.H. Lee (GIST, Korea), S. Thompson (U. Florida – Gainesville), A. Neugroschel (U. Florida – Gainesville)

Ph.D. Thesis Supervisor:

Prof. Veena Misra, North Carolina State University

Postdoctoral Supervisor:

Gennadi Bersuker, SEMATECH

List of Students Supervised:

Provided significant guidance and training to many students interns (2-yr Associate Degree up to Ph.D.) on experimental, theory, and lab practices of electrical characterization and reliability on novel materials and device structures while at SEMATECH.  

Selected Fellowships, Honors, and Awards
  • (2007) Senior Member of the IEEE
  • (2004) Corporate Excellence Award – SEMATECH’s highest technical honor for pulse-based electrical characterization techniques for the evaluation of high-k gate dielectrics
  • (1998-2000) Engineering Research Center Fellowship – Center for Advanced Electronic Materials Processes, NC State University
  • (1996-98) Graduate Engineering Education Fellowship – National Science Foundation
  • (1996) National Member of the Year – One national award from the National Society of Black Engineers is chosen annually from the entire student membership