Chadwin Young

Associate Professor - Materials Science & Engineering
Director of Advanced Electrical Characterization Laboratory (AECL)
 
972-883-5770
RL4.404
Research Group Website
ORCID
Tags: Electrical Engineering Materials Science and Engineering Computer Engineering

Professional Preparation

Ph.D. - Electrical Engineering
North Carolina State Univ. - 2004
M.S. - Electrical Engineering
North Carolina State Univ. - 1998
B.S. - Electrical Engineering
Univ. of Texas - Austin - 1996

Research Areas

Electrical Characterization and Reliability

Novel Characterization Development

  • Involved the measurement and evaluation of transistors and capacitors of experimental gate stacks and device structures (alternative gate electrodes, ultra-thin oxides, oxynitrides, and high-dielectric constant insulators, non-planar devices, and high mobility substrates)
  • Engaged in the electrical characterization and reliability of projected material and device architectures below the 22 nm node as defined by the International Technology Roadmap for Semiconductors (ITRS) as well as other future device architectures, which can call for high-k dielectrics and high mobility and/or flexible substrate material systems

Research Interests

  • Electrical Characterization Methodologies
  • Reliability Characterization Methodologies
  • Solid State Device Physics
  • Electrical properties of materials
  • MOS modeling (quantum effects, etc.)
  • Nanotechnology
  • Flexible Electronics 
  • Future Energy Needs (Renewable, low power operation, etc.)

Publications

A new dielectric degradation phenomenon in nMOS high-k devices under positive bias stress - Conference Paper
Breakdown Characteristics of High-k Gate Dielectrics with Metal Gates - Conference Paper
Characterization and reliability measurement issues in devices with novel gate stack devices - Journal Article
Characterization of HfSiON Gate Dielectric with TiN Gate on Multi-Gate MOSFET - Conference Paper
Comparison of novel BTI measurements for high-k dielectric MOSFETs - Conference Paper
Discussion Group (DG) summary: Dielectric Electrical Characterization - Conference Paper
Effect of substrate hot carrier stress on high-k gate stack - Conference Paper
Electrical Characterization Methodologies for the Assessment of High-k Gate Dielectric Stacks - Conference Paper
Electrical characterization and analysis techniques for the high-κ era - Journal Article
Enhanced Surface Preparation Techniques for the Si/High-k Interface - Journal Article

Appointments

Associate Professor
University of Texas at Dallas [2018–Present]
Assistant Professor
University of Texas at Dallas [2012–2018]
Senior Member of Technical Staff
SEMATECH [2010–2012]
Member of Technical Staff
SEMATECH [2008–2010]
Project Engineer
SEMATECH [2006–2008]
Post Doc
SEMATECH [2004–2006]
PhD Intern
SEMATECH [2001–2004]
Intern
IBM, Motorola, Four Dimensions, Los Alamos Nat. Lab., etc. [1990–2000]

News Articles

Jonsson School Engineer Gets CAREER Grant for Electronics Work
A University of Texas at Dallas engineer is investigating new semiconductor materials for possible use in large area, flexible electronics. 

Dr. Chadwin Young, an assistant professor of materials science and engineering in the Erik Jonsson School of Engineering and Computer Science, recently received a five-year, $500,000 Faculty Early Career Development (CAREER) award from the National Science Foundation to pursue this work. 

“On one hand, engineers are looking for new materials for transistors that will make electronic devices smaller and faster, and use less power,” Young said. “That’s what semiconductor companies who manufacture computer chips are driven by. But there are also other markets that need transistors to be printed on big sheets of plastic or other flexible substrates at a much reduced cost.”

Activities

Professional Memberships
  • Institute of Electrical and Electronics Engineers (IEEE)
  • American Vacuum Society (AVS)
  • Electrochemical Society (ECS)
Professional Service
  • IEEE Semiconductor Interface Specialists Conference – Executive Committee (2011-2013)
  • IEEE International Reliability Physics Symposium – Technical Program Committee (2008-2013)
  • IEEE International Electron Devices Meeting – Technical Program Committee (2011-2012)
  • IEEE Semiconductor Interface Specialists Conference – Technical Program Committee (2008-11)
  • IEEE International Integrated Reliability Workshop – Executive Committee (2005-2010)
  • IEEE International Integrated Reliability Workshop – Technical Program Committee (2005-2012)
  • Workshop on Dielectrics in Microelectronics – Steering Committee Member (2010-present)
Reviewer Activities
  • IEEE Electron Device Letters
  • IEEE Transactions on Electron Devices
  • IEEE Transactions on Device and Materials Reliability
  • Applied Physics Letters
  • Microelectronic Engineering
  • Microelectronic Reliability
  • Solid-State Electronics
Editorships
  • Guest Editor for IEEE Trans. Device and Materials ReliabilityIIRW Special Issues 2006-07 and 2008-09
Collaborations

List of External Collaborators During Past Four Years:

S. Datta (Penn State), J. DelAlamo (MIT), P. Majhi (Intel), P. Lenahan (Penn State), D.S. Ang (NTU), B.K. Knowlton (Boise State), R.Jammy (SEMATECH),  P.Kirsch (SEMATECH), G. Bersuker (SEMATECH), Jason Ryan (NIST), Jason Campbell (NIST), L. Larcher (U. Modena), A. Padova (U. Modena), R. Choi (Inha Univ., Korea), B.H. Lee (GIST, Korea), S. Thompson (U. Florida – Gainesville), A. Neugroschel (U. Florida – Gainesville)

Ph.D. Thesis Supervisor:

Prof. Veena Misra, North Carolina State University

Postdoctoral Supervisor:

Gennadi Bersuker, SEMATECH

List of Students Supervised:

Provided significant guidance and training to many students interns (2-yr Associate Degree up to Ph.D.) on experimental, theory, and lab practices of electrical characterization and reliability on novel materials and device structures while at SEMATECH.  

Selected Fellowships, Honors, and Awards
  • (2007) Senior Member of the IEEE
  • (2004) Corporate Excellence Award – SEMATECH’s highest technical honor for pulse-based electrical characterization techniques for the evaluation of high-k gate dielectrics
  • (1998-2000) Engineering Research Center Fellowship – Center for Advanced Electronic Materials Processes, NC State University
  • (1996-98) Graduate Engineering Education Fellowship – National Science Foundation
  • (1996) National Member of the Year – One national award from the National Society of Black Engineers is chosen annually from the entire student membership